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E Series Multifunction DAQ –

20 kS/s, 16-Bit, 16 Analog Inputs

255

National Instruments • Tel: (800) 433-3488 • Fax: (512) 683-9300 • [email protected] • ni.com

E Series DAQ Devices

Measurements

Table 2. NI 601xE Analog Input Accuracy Speciﬁcations

Absolute Accuracy Relative Accuracy

Nominal % of Reading Offset Noise + Quantization (µV) Temp Absolute Accuracy Resolution (µV)

Range (V) 24 Hrs 90 Days 1 Year (

V) Single Pt. Averaged Drift (%/°C) at Full Scale (mV) Single Pt. Averaged

±10.0 0.0058 0.0078 0.0100 397.2 526.4 45.8 0.0002 1.443 602.7 60.3

±5.0 0.0208 0.0228 0.0250 200.6 263.2 22.9 0.0007 1.474 301.4 30.1

±1.0 0.0208 0.0228 0.0250 43.3 52.6 4.6 0.0007 0.298 60.3 6.0

±0.1 0.0408 0.0428 0.0450 7.9 8.4 0.7 0.0012 0.054 9.6 1.0

0 to 10 0.0058 0.0078 0.0100 244.6 263.2 22.9 0.0002 1.268 301.4 30.1

0 to 5 0.0208 0.0228 0.0250 124.3 131.6 11.4 0.0007 1.386 150.7 15.1

0 to 1 0.0208 0.0228 0.0250 28.1 26.3 2.3 0.0007 0.280 30.1 3.0

0 to 0.1 0.0408 0.0428 0.0450 6.4 7.0 0.6 0.0012 0.052 8.4 0.8

±10.0 0.0075 0.0095 0.0117 815.4 1029.1 91.6 0.0005 2.077 1205.4 120.5

±5.0 0.0225 0.0245 0.0267 409.7 514.6 45.8 0.0010 1.791 602.7 60.3

±1.0 0.0225 0.0245 0.0267 85.1 102.9 9.2 0.0010 0.361 120.5 12.1

±0.1 0.0425 0.0445 0.0467 12.1 12.2 1.1 0.0015 0.060 14.5 1.4

0 to 10 0.0075 0.0095 0.0117 591.2 514.6 45.8 0.0005 1.807 602.7 60.3

0 to 5 0.0225 0.0245 0.0267 297.6 257.3 22.9 0.0010 1.656 301.4 30.1

0 to 1 0.0225 0.0245 0.0267 62.7 51.5 4.6 0.0010 0.334 60.3 6.0

0 to 0.1 0.0425 0.0445 0.0467 9.9 8.0 0.7 0.0015 0.057 9.6 1.0

Note: Accuracies are valid for measurements following an internal E Series Calibration. Averaged numbers assume dithering and averaging of 100 single-channel readings. Measurement accuracies are listed for

operational temperatures within ±1 °C of internal calibration temperature and ±10 °C of external or factory-calibration temperature. One-year calibration interval recommended. The Absolute Accuracy at Full Scale

calculations were performed for a maximum range input voltage (for example, 10 V for the ±10 V range) after one year, assuming 100 pt averaging of data. See overview on page 234 for example calculations.

PCI, AT, and DAQPadDAQCard

Absolute Accuracy

Nominal Range (V) % of Reading Temp Absolute Accuracy

Positive FS Negative FS 24 Hrs 90 Days 1 Year

Offset

(mV) Drift (%/°C) at Full Scale (mV)

10 -10 0.014 0.016 0.018 5.408 0.0002 7.208

10 0 0.014 0.016 0.018 2.966 0.0002 4.766

Note: Temp Drift applies only if ambient is greater than ±10 °C of previous external calibration. See page 234 for example calculations.

Table 3. NI 601xE Analog Output Accuracy Speciﬁcations.

Not on DAQCard-AI-16XE-50 Not on DAQCard-AI-16XE-50

Timing

PFI / Trigger

I/O Connector

RTSI Bus

PCI/PCMCIA/ISA/Parallel – I/O Channel

Digital I/O (8)

16-Bit

Sampling

A/D

Converter

EEPROM

Configuration

Memory

NI-PGIA

Gain

Amplifier

–

Calibration

Mux

Mux Mode

Selection

Switches

Analog

Muxes

Voltage

REF

Calibration

DACs

Trigger

Analog

Trigger

Circuitry

Trigger Level

DACs

Calibration

DACs

DAC0

DAC1

DAQ - STC

Analog Input

Timing/Control

Analog Output

Timing/Control

Digital I/O

Trigger

Counter/

Timing I/O

RTSI Bus

Interface

DMA/

Interrupt

Request

Bus

Interface

(8)

DAC

FIFO

Data (16)

AI Control

Data (16)

Analog

Input

Control

EEPROM

Control

DMA

Interface

MIO

Interface

DAQ-STC

Bus

Interface

Plug

and

Play

Analog

Output

Control

8255

DIO

Control

Bus

Interface

IRQ

DMA

Bus interface

DAQPnP

or MITE

AO Control

ADC

FIFO

Config.

Memory

Figure 1. NI 601xE Hardware Block Diagram

See page 233 in the E Series Multifunction DAQ

Overview for I/O connector diagrams.

See page 271 for more detailed speciﬁcations.

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